Separating temporally-overlapped waveforms with electrooptic sampling
|Title||Separating temporally-overlapped waveforms with electrooptic sampling|
|Publication Type||Journal Article|
|Year of Publication||1996|
|Authors||Shah, S. A., Zeng A., Wong W. S., Jackson M. K., Pouliot L., Lecours A., and Currie J. F.|
|Journal||Optical and Quantum Electronics|
The authors report on a new approach in ultrafast characterization of electronic devices to recover temporally-overlapping incident and reflected signals near a device. The technique involves electrooptic measurement at two locations. With suitable processing, the measured waveforms can be decomposed into components propagating towards and away from the device. Experimental results for coplanar structures are shown.